Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-07-18
2006-07-18
Siek, Vuthe (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
Reexamination Certificate
active
07080340
ABSTRACT:
In a system10for designing an integrated circuit, a preliminary design of the integrated circuit is defined and critical interconnect lines in the preliminary design are identified. Further, any critical interconnect lines which are affected by crossing lines in the preliminary design are identified, and a transmission line model35is defined to represent each critical interconnect line. A layout design of the integrated circuit, comprising circuit components and parameters thereof, is then defined using the preliminary design and the transmission line model35for each critical interconnect line. Component parameters are then extracted from the layout design for simulation of the design using the extracted component parameters. During this design process, for each transmission line model35representing a critical interconnect line affected by a crossing line, an environment terminal36is provided. The environment terminal36comprises a connection to the model35via at least one circuit component representing the effect of the crossing line on the model. The environment terminal36is connected to the appropriate crossing line in the integrated circuit design, whereby crossing line effects are accommodated in the design process.
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Gordin Rachel
Goren David
Zelikson Michael
Doan Nghia M.
Kaufman Stephen C.
Siek Vuthe
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