Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-12-05
2006-12-05
Lin, Sun James (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
07146580
ABSTRACT:
Interchangeable integrated circuit building blocks include functionally equivalent integrated circuit building blocks, having similar footprints, and having one or more dissimilar features or operational characteristics. The functionally equivalent integrated circuit building blocks are interchangeable in a design layout without having to re-place and re-route. The functionally equivalent integrated circuit building blocks are optionally interchangeable on a building block by building block basis. One or more detection features are optionally included in one or more of the interchangeable integrated circuit building blocks. The detection features facilitate detection of the interchangeable integrated circuit building blocks. Area, space, and/or width design rule checks are optionally focused at junctions of detected integrated circuit building blocks.
REFERENCES:
patent: 4245249 (1981-01-01), Tissot
patent: 5076375 (1991-12-01), Dillon et al.
patent: 5097422 (1992-03-01), Corbin et al.
patent: 5210701 (1993-05-01), Hana et al.
patent: 5656904 (1997-08-01), Lander
Barbera George Edward
Jensen David Donald
You Xiaohui
Broadcom Corporation
Lin Sun James
Sterne Kessler Goldstein & Fox PLLC
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