Inter-device connection test circuit generating method,...

Details Inter-device connection test circuit generating method,... Inter-device connection test circuit generating method,...

2011-07-19

2011-07-19

Trimmings, John P (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Transmission facility testing

C714S025000, C714S724000, C714S713000, C714S716000, C714S727000, C714S734000, C714S725000, C714S733000, C716S101000, C716S100000, C716S103000, C716S104000, C716S116000, C716S117000, C716S121000, C716S126000, C716S128000, C716S136000, C716S137000

Reexamination Certificate

active

07984343

ABSTRACT:
A test circuit can use a simple test pattern data without customization for each substrate and considerably reduce a test preparation process. A connection test circuit is generated by receiving the input of the data of the connection relation indicating the devices mutually line-connected among a plurality of devices, the number of connection lines corresponding to the respective connection relations, and the device outputting a test result, sequentially searching for a connection destination device from the output terminal of an output device, and embedding a test circuit module in a test route.

REFERENCES:
patent: 6347387 (2002-02-01), Fischer
patent: 6678645 (2004-01-01), Rajsuman et al.
patent: 7730435 (2010-06-01), Pritchard et al.
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patent: 11-023667 (1999-01-01), None
patent: 11-44741 (1999-02-01), None
patent: 2000-121696 (2000-04-01), None
patent: 2004-151061 (2004-05-01), None
patent: 2005-283205 (2005-10-01), None
International Search Report for PCT/JP2007/000230, mailed Jun. 19, 2007.

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