Optics: measuring and testing – Shape or surface configuration – By focus detection
Reexamination Certificate
2011-01-25
2011-01-25
Punnoose, Roy (Department: 2886)
Optics: measuring and testing
Shape or surface configuration
By focus detection
C356S630000
Reexamination Certificate
active
07876456
ABSTRACT:
Methods for providing compensation for non-uniform response of a light source and wavelength detector subsystem of a chromatic point sensor (CPS) are provided. Light from the light source is input into an optical path that bypasses the measurement path through a CPS optical pen and provides the bypass light to the wavelength detector to provide a raw intensity profile distributed over the pixels of detector. The resulting set of raw intensity profile signals are analyzed to determine a set of error compensation factors for wavelength-dependent intensity variations that occur in the raw intensity profile signals. Later, the error compensation factors may be applied to reduce distortions and asymmetries that may otherwise occur in the shape of the signals in the peak region of CPS distance measurement profile signal data. The disclosed methods may provide enhanced accuracy, robustness, field-testing, and interchangeability for CPS components, in various embodiments.
REFERENCES:
patent: 4585349 (1986-04-01), Gross
patent: 4820048 (1989-04-01), Barnard
patent: 5379065 (1995-01-01), Cutts
patent: 5578745 (1996-11-01), Bayer
patent: 5644512 (1997-07-01), Chernoff
patent: 5785651 (1998-07-01), Kuhn
patent: 6016684 (2000-01-01), Scheer
patent: 6028008 (2000-02-01), Bayer
patent: 6029115 (2000-02-01), Tracy
patent: 6327041 (2001-12-01), Guern
patent: 6480285 (2002-11-01), Hill
patent: 6869480 (2005-03-01), Abel
patent: 7002143 (2006-02-01), Parker
patent: 2005/0030528 (2005-02-01), Geffen
patent: 2006/0024061 (2006-02-01), Wirth et al.
patent: 2006/0109483 (2006-05-01), Marx
patent: 2006/0197949 (2006-09-01), Bouzid
patent: 2007/0148792 (2007-06-01), Marx
patent: 2010/0225926 (2010-09-01), van Amstel et al.
patent: 42 11 875 (1993-10-01), None
patent: 102 28 477 (2004-01-01), None
patent: 10 2004 052 205 (2006-05-01), None
patent: 1 647 799 (2006-04-01), None
European Search Report mailed Mar. 6, 2009, issued in corresponding European Application No. EP 08 16 7845, filed Oct. 29, 2008.
Geary, J.M., “Introduction to Lens Design,” Willmann-Bell, Richmond, Va., 2002, p. 176.
Molesini, G., and F. Quercioli, “Pseudocolor Effects of Longitudinal Chromatic Aberration,” Journal of Optics (Paris) 17(6):279-282, Nov. 1986.
Nahum, M., “On-site Calibration Method and Object for Chromatic Point Sensors,” U.S. Appl. No. 12/330,431, filed Dec. 8, 2008.
“Optical Pens: Micrometric Measurement Range,” Stil S.A., Aix-en-Provence, France, product brochure published on or before Mar. 6, 2007.
Sesko, D.W., “Dynamic Compensation of Chromatic Point Sensor Intensity Profile Data Selection,” U.S. Appl. No. 11/940,214, filed Nov. 14, 2007.
Smith, W.J., “Modern Optical Engineering,” 3d ed., SPIE Press—McGraw-Hill, New York, 2000, p. 94.
Villatoro, J., et al., “Fabrication and Modeling of Uniform-Waist Single-Mode Tapered Optical Fiber Sensors,” Applied Optics 42(13):2278-2283, May 1, 2003.
Christensen O'Connor Johnson & Kindness PLLC
Mitutoyo Corporation
Punnoose Roy
LandOfFree
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