Computer-aided design and analysis of circuits and semiconductor – Design of semiconductor mask or reticle – Layout generation
Reexamination Certificate
2011-06-21
2011-06-21
Garbowski, Leigh Marie (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Design of semiconductor mask or reticle
Layout generation
C716S052000
Reexamination Certificate
active
07966586
ABSTRACT:
The present invention is directed to an improved method, system, and computer program product for accessing and analyzing patterns in the integrated circuit design. The method, system or computer program product includes generating an intelligent signature for a pattern. The derived pattern signature is an intelligent pattern identifier because it retains only essential information about a pattern that corresponds to lithography printable portions of the pattern. Accordingly, one pattern signature can represent a group of design patterns that are equivalents from a lithography perspective.
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Doddi Srini
Fang Weiping
Lay Kuang-Hao
Lei Junjiang
Cadence Design Systems Inc.
Garbowski Leigh Marie
Vista IP Law Group LLP
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