Integrated transportation control for wafer fabrication...

Data processing: generic control systems or specific application – Specific application – apparatus or process – Article handling

Reexamination Certificate

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C700S121000

Reexamination Certificate

active

07925380

ABSTRACT:
System and method for implementing integrated transportation control in a wafer fabrication facility are described. One embodiment is a factory automation system for a wafer fabrication facility (“fab”) comprising a plurality of bays, wherein each of the bays comprise a plurality of equipment interconnected by an intrabay overhead transport (“OHT”) system, and first and second interbay OHT systems each for interconnecting the intrabay OHT systems. The factory automation system comprises a manufacturing execution system (“MES”) for providing lot information regarding wafers being processed in the fab, a material control system (“MCS”) for providing traffic information regarding transportation of wafers in the fab, and an integrated transportation control (“ITC”) system for using the lot information from the MES and the traffic information from the MCS for selecting a destination and a route to the selected destination for a wafer carrier containing wafers in response to a transfer request.

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patent: 557480 (2003-10-01), None
J. T. Lin et al., “Connecting Transport AMHS In A Wafer Fab”, International Journal of Production Research ISSN 0020-7543 print/ISSN 1366-588X online, 2003 Taylor & Francis Ltd., 5 pages.
Devadas Pillai et al., “Integration of 300 mm Fab Layouts and Material Handling Automation”, 4 pages.
Chinese Patent Office, Office Action mailed Feb. 5, 2010, Application No. 2006101647334, 7 pages.
Taiwanese Patent Office, Office Action mailed Mar. 31, 2010, Application No. 095143539, 6 pages.

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