Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having schottky gate
Reexamination Certificate
2011-08-02
2011-08-02
Luu, Chuong A (Department: 2813)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having schottky gate
C438S172000, C257SE21047
Reexamination Certificate
active
07989277
ABSTRACT:
A process for fabricating an integrated group III nitride structure comprising high electron mobility transistors (HEMTs) and Schottky diodes, and the resulting structure, are disclosed. Integration of vertical junction Schottky diodes is enabled, and the parasitic capacitance and resistance as well as the physical size of the diode are minimized. A process for fabricating an integrated group III nitride structure comprising double-heterostructure field effect transistors (DHFETs) and Schottky diodes and the resulting structure are also disclosed.
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patent: 2003/0235974 (2003-12-01), Martinez et al.
patent: 2010/0159664 (2010-06-01), Gluschenkov et al.
Dang, G., et al., “High voltage GaN Schottky Rectifiers,” IEEE Trans. On Electronic Devices, vol. 47, No. 4, Apr. 2000.
Chow David
Hitko Don
Luh Louis
Micovic Miroslav
Wang Keh-Chung
Doan Nga
HRL Laboratories LLC
Ladas & Parry
Luu Chuong A
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