Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate
2007-04-10
2007-04-10
Phan, Trong (Department: 2827)
Static information storage and retrieval
Read/write circuit
Bad bit
C365S201000
Reexamination Certificate
active
11189018
ABSTRACT:
An integrated semiconductor memory has regular row and column lines, which can be replaced with redundant row and column lines in the event of a fault. Following initialization of the memory cells with an initialization data item, a data generator circuit writes an identification data item to the memory cells along a regular row or column line. A faulty regular row or column line is replaced with the associated redundant row or column line. Next, the initialization data item is written to memory cells along sound regular row or column lines and the respective identification data item is written to the memory cells along a faulty regular row or column line. Faulty regular row or column lines have the same data value in their memory cells as the redundant row or column lines replacing them.
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Perner Martin
Versen Martin
Edell Shapiro & Finnan LLC
Infineon - Technologies AG
Phan Trong
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