Integrated semiconductor memory with parallel test capability an

Details Integrated semiconductor memory with parallel test capability an Integrated semiconductor memory with parallel test capability an

1992-11-10

1994-03-08

Canney, Vincent P.

Excavating

371 103, 365201, G11C 700

Patent

active

052933865

ABSTRACT:
An integrated semiconductor memory includes a parallel test device and block groups. The parallel test device is used for writing in and evaluating data to be written into and read out of the semiconductor memory. Several groups of memory cells can be simultaneously tested for operation in a test mode, with each group being disposed along a respective word line. The data read out during the process can be evaluated by the parallel test device. The result of the evaluation is present, separately for each group of memory cells, on I/O data lines of the semiconductor memory. The semiconductor memory can also have redundant memory cells, in which case defective memory cells or groups of memory cells can be replaced in connection with the test mode.

REFERENCES:
patent: 4464750 (1984-08-01), Tatematsu
patent: 4541090 (1985-09-01), Shiragasawa
patent: 4742489 (1988-05-01), Hoffmann
patent: 4742490 (1988-05-01), Hoffmann
patent: 4803656 (1988-02-01), Takemae
patent: 4862416 (1989-08-01), Takeuchi
patent: 5075892 (1991-12-01), Choy
patent: 5157664 (1992-10-01), Waite
IEEE Trans. on Computers, (1989) Mar., No. 3, New York, US, Pinaki Mazumder and Janak K. Patel: "Parallel Testing for Pattern-Sensitive Faults in Semiconductor Random-Access Memories".

Affiliated with

Also associated with

Rating

Integrated semiconductor memory with parallel test capability an does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Integrated semiconductor memory with parallel test capability an, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Integrated semiconductor memory with parallel test capability an will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-158566