Integrated semiconductor memory with generation of data

Static information storage and retrieval – Read/write circuit – Including signal comparison

Reexamination Certificate

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C365S198000, C365S191000, C365S194000

Reexamination Certificate

active

07835197

ABSTRACT:
An integrated semiconductor memory with generation of data comprises a clock connection to apply a clock signal, a memory cell array with memory cells to store data of a first data record and a data generator circuit with a first input connection to apply the data of the first data record, with a first output connection to output data of a second data record, and with a second output connection to generate a first control signal. The data generator circuit includes an evaluation unit whose input is supplied with the first data record, the second data record and a second control signal, the second control signal being delayed by one clock period of the clock signal with respect to the first control signal. The data generator circuit is adapted to generate the data values of the data of the second data record in dependence on the evaluation of the data values of the first and second data record and the second control signal.

REFERENCES:
patent: 4667337 (1987-05-01), Fletcher
patent: 5890005 (1999-03-01), Lindholm
patent: 6735129 (2004-05-01), Akasaki et al.
patent: 7411840 (2008-08-01), Gaskins et al.

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