Integrated semiconductor memory comprising at least one word...

Details Integrated semiconductor memory comprising at least one word... Integrated semiconductor memory comprising at least one word...

2007-04-17

2007-04-17

Phung, Anh (Department: 2824)

Static information storage and retrieval

Read/write circuit

Testing

C365S230060

Reexamination Certificate

active

11218913

ABSTRACT:
A semiconductor memory and a test method for testing whether word line segments (12) are floating after an activation operation or a deactivation operation is disclosed. For this purpose, the charge-reversal current (I) that occurs in the event of a word line segment (12) being subjected to charge reversal or a charge quantity (Q) which is fed to the word line (12) or conducted away from the word line segment (12) as a result of this is measured. If, upon activation or deactivation of a word line segment (12), the measured charge-reversal current (I) or the corresponding charge quantity (Q) is less than a lower limit value, it is ascertained that the relevant word line segment (12) has a defective contact terminal. In this way, high-impedance or defective contact hole fillings can thereby be identified and the associated word line segments (12) can be replaced by redundant word lines.

REFERENCES:
patent: 5602784 (1997-02-01), Kojima et al.
patent: 5761135 (1998-06-01), Lee
patent: 6570793 (2003-05-01), Stender
patent: 6687146 (2004-02-01), Kurjanowicz et al.
patent: 7085175 (2006-08-01), Remington et al.

Affiliated with

Also associated with

Rating

Integrated semiconductor memory comprising at least one word... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Integrated semiconductor memory comprising at least one word..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Integrated semiconductor memory comprising at least one word... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3723549