Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate
2005-09-20
2005-09-20
Phung, Anh (Department: 2824)
Static information storage and retrieval
Read/write circuit
Testing
C365S230010, C365S230030, C365S225700, C711S115000, C711S170000
Reexamination Certificate
active
06947341
ABSTRACT:
An integrated semiconductor memory chip includes hardwired presence detect data which can be accessed for transmission to a location external to the memory chip as well as logic allowing additional presence detect data to be programmed in the memory chip after fabrication of the memory chip. Storing the presence detect data on the memory chip rather than on a separate integrated circuit can help reduce the number of integrated chips required for a memory module, which may include multiple DRAM or other memory chips. Hardwiring at least some of the presence detect data during fabrication of the chip can reduce the number of programming errors as well as the number of mismatches that might otherwise occur if a separate presence detect data chip were used. On the other hand, the capability of programming presence detect data after fabrication of the memory chip provides additional flexibility, allowing the foregoing techniques to be used with a wide variety of memory chips and modules.
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Roberts Gordon D.
Stubbs Eric T.
Dickstein , Shapiro, Morin & Oshinsky, LLP
Le Toan
Phung Anh
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