Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-10-17
2006-10-17
Siek, Vuthe (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C714S032000, C703S014000
Reexamination Certificate
active
07124383
ABSTRACT:
Integrated proof flow methods and apparatuses are discussed. Integrated proof flow refers to attempting both formal verification and nonformal verification. A coverage metric can be changed by both attempting formal verification and by attempting nonformal verification. Some embodiments of the present invention provide proof flow methods that integrate verification and nonformal verification (e.g., bounded verification, multi-point proof, and/or vector-based simulation) to prove one or more properties in a circuit design.
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Chen Kuang-Chien
Wang Bow-Yaw
Bingham & McCutchen LLP
Cadence Design Systems Inc.
Siek Vuthe
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