Integrated memory device and method for operating the same

Static information storage and retrieval – Systems using particular element – Amorphous

Reexamination Certificate

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C365S100000, C365S148000

Reexamination Certificate

active

11339846

ABSTRACT:
A memory device includes an array of memory cells that include a memory element having a non-reactive resistance whose magnitude is programmable to assume a high-resistance state or a low-resistance state. Sets of first and second lines provide access to the memory cells, wherein the memory element of each memory cell is coupled between one of the first lines and one of the second lines. A checking unit determines whether to invert data values to be stored in memory cells coupled to at least a section of respective ones of the first lines based on a number of memory cells that would be programmed in the high-resistance state or the low-resistance state as a result of the data values in order to reduce the number memory cells programmed in the low-resistance state and the resulting leakage current.

REFERENCES:
patent: 6418049 (2002-07-01), Kozicki et al.
patent: 6570795 (2003-05-01), Fricke et al.
patent: 6731528 (2004-05-01), Hush et al.

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