Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate
2005-10-18
2005-10-18
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
C702S099000
Reexamination Certificate
active
06957163
ABSTRACT:
An integrated circuit system has a reference data table for holding information that is used to control at least one circuit block in the system and also has a power supply circuit, a body bias control circuit, a clock delivery circuit, a temperature monitor circuit, and/or a configuration control circuit. The performance of the system is improved by obtaining system performance data by testing the system at different supply voltages, different body-bias voltages, different clock speeds, and/or different temperatures. Values based on the data are entered into the reference data table. The power supply circuit, the body bias control circuit, the clock delivery circuit, and/or the temperature monitor circuit data is adjusted using the entered values.
REFERENCES:
patent: 5781060 (1998-07-01), Sugawara
patent: 5996083 (1999-11-01), Gupta et al.
patent: 6006169 (1999-12-01), Sandhu et al.
patent: 6345362 (2002-02-01), Bertin et al.
patent: 6662302 (2003-12-01), Garey
patent: 6772352 (2004-08-01), Williams et al.
patent: 2003/0142550 (2003-07-01), Kawahara et al.
Fuerle Richard D.
Hoff Marc S.
Miller Craig Steven
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