Integrated circuit with phase-change memory cells and method...

Static information storage and retrieval – Systems using particular element – Resistive

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C365S163000, C365S175000

Reexamination Certificate

active

07911822

ABSTRACT:
The present invention relates to an integrated circuit comprising a plurality of bitlines (b1) and a plurality of word-lines (w1) as well as a plurality of memory-cells (MC) coupled between a separate bit-line/word-line pair of the plurality of bit-lines (b1) and wordlines (w1) for storing data in the memory cell. Each memory cell (MC) comprises a selecting unit (T) and a programmable resistance (R). The value of the phase-change resistance (R) is greater than the value of a first phase-change resistance (Ropt) defined by a supply voltage (Vdd) divided by a maximum drive current (Im) through said first phase-change resistor (Ropt).

REFERENCES:
patent: 6912146 (2005-06-01), Gill et al.
patent: 6982903 (2006-01-01), Bertin et al.
patent: 7042760 (2006-05-01), Hwang et al.
patent: 7110286 (2006-09-01), Choi et al.
patent: 7130214 (2006-10-01), Lee
patent: 7136299 (2006-11-01), Chu et al.
patent: 7180771 (2007-02-01), Cho et al.
patent: 7289351 (2007-10-01), Chen et al.
patent: 7304885 (2007-12-01), Cho et al.
patent: 7304886 (2007-12-01), Cho et al.
patent: 7308067 (2007-12-01), Lowrey et al.
patent: 00/57498 (2000-09-01), None
patent: 2004/025659 (2004-03-01), None
patent: 2004057618 (2004-07-01), None
“Writing Current Reduction for High-Density Phase-Change RAM”, Hwang Yn et al, International Electron Devices Meeting 2003, IEDM, Technical Digest, Washington DC, Dec. 8-10, 2003.
“Full Intergration and cell characteristics for 64 mb Nonvolatile PRAM”, Lee S H et al. VLSI Technology, 2004, Digest of Technical Papers, 2004 Symposium on Honolulu HI USA Jun. 15-17, 2004 Piscataway NJ, IEEE, Jun. 15, 2004.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Integrated circuit with phase-change memory cells and method... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Integrated circuit with phase-change memory cells and method..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Integrated circuit with phase-change memory cells and method... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2700538

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.