Integrated circuit with control circuit for performing...

Details Integrated circuit with control circuit for performing... Integrated circuit with control circuit for performing...

2011-01-18

2011-01-18

Pham, Ly D (Department: 2827)

Static information storage and retrieval

Read/write circuit

Testing

C365S233100

Reexamination Certificate

active

07872931

ABSTRACT:
An integrated circuit includes an array of memory cells, a clock generator configured to generate a clock signal, and a control circuit configured to perform a retention test on the array of memory cells based on the clock signal. A period of the clock signal defines a retention period for the retention test.

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