Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-11-14
2006-11-14
Lin, Sun James (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
07137087
ABSTRACT:
A method for minimizing compilation time of a test case during development testing of an integrated circuit is provided. The method initiates with identifying a test case. The test case is associated with the tasks and the tasks are written as text files. Then, a file associated with the test case is generated. Next, a sequence of the tasks of the file is determined. Then, hardware description language (HDL) tasks, associated with the tasks of the file according to the sequence, are identified. Next, a simulation of an integrated circuit is performed through the HDL tasks. A computer readable medium having program instructions for minimizing compilation time of a test case during development testing of an integrated circuit and a system for testing an integrated circuit design are also provided.
REFERENCES:
patent: 5437037 (1995-07-01), Furuichi
patent: 5838948 (1998-11-01), Bunza
patent: 5940779 (1999-08-01), Gaitonde et al.
patent: 6088823 (2000-07-01), Ayres et al.
patent: 6167363 (2000-12-01), Stapleton
patent: 6324671 (2001-11-01), Ratzel et al.
patent: 6427224 (2002-07-01), Devins et al.
patent: 6466898 (2002-10-01), Chan
patent: 6539520 (2003-03-01), Tiong et al.
patent: 6701491 (2004-03-01), Yang
patent: 6813599 (2004-11-01), Court et al.
patent: 6851102 (2005-02-01), Tsuchiya
patent: 2004/0049753 (2004-03-01), Kabuo
patent: 2004/0128641 (2004-07-01), Broberg, III et al.
Jambhekar Vivek
Mohanty Purna
Thangavelu Sivam
Adaptec, Inc.
Lin Sun James
Martine & Penilla & Gencarella LLP
LandOfFree
Integrated circuit verification scheme does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Integrated circuit verification scheme, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Integrated circuit verification scheme will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3652332