Integrated circuit tester having amorphous logic for real-time d

Details Integrated circuit tester having amorphous logic for real-time d Integrated circuit tester having amorphous logic for real-time d

1998-06-12

2000-05-02

Karlsen, Ernest

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

714724, G01R 3128

Patent

active

060576790

ABSTRACT:
A general purpose integrated circuit (IC) tester includes a set of channels, one for each input or output pin of an IC device under test (DUT). Each channel is programmed by a host computer to either supply a test signal to a DUT I/O pin or sample a DUT output signal appearing at the I/O pin and produce sample data representing its magnitude or logic state. The tester also includes an amorphous logic circuit (ALC) having a set of input and output terminals and a programmable logic circuit interconnecting the input and output terminals. Some of the ALC input and output terminals receive the sample data produced by each channel and other ALC terminals send control signals directly to each channel. Other ALC terminals transmit data to the host computer. When it programs the channels to perform a test, the host computer also programs the ALC to control various operations of the channels during the test, to perform a real-time analysis of the test data produced by the channels, and to communicate results of the analysis to the host.

REFERENCES:
patent: 4242751 (1980-12-01), Henckels et al.
patent: 4709366 (1987-11-01), Scott et al.
patent: 5235271 (1993-08-01), Kira
patent: 5581491 (1996-12-01), Biwer et al.

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