Integrated circuit structures for preventing charging damage

Details Integrated circuit structures for preventing charging damage Integrated circuit structures for preventing charging damage

2006-01-09

2008-12-30

Ngo, Ngan (Department: 2818)

Active solid-state devices (e.g., transistors, solid-state diode

Field effect device

Having insulated electrode

C257S360000, C257SE27014

Reexamination Certificate

active

07470959

ABSTRACT:
Disclosed is a circuit for preventing charging damage in an integrated circuit design, for example, a design having silicon over insulator (SOI) transistors. The circuit prevents damage from charging during processing to the gate of IC devices by assigning regions to the IC design such that the devices located within the regions have electrically independent nets, identifying devices that may have a voltage differential between the source or drain, and gate as susceptible devices within a given region, and connecting an element across the source or drain, and the gate of each of the susceptible devices such that the element is positioned within the region. Alternatively, the method/circuit provides for connecting compensating conductors to an element to eliminate potential charging damage.

REFERENCES:
patent: 5869877 (1999-02-01), Patrick et al.
patent: 6417544 (2002-07-01), Jun et al.
patent: 6586765 (2003-07-01), Lin et al.
patent: 6614051 (2003-09-01), Ma
patent: 6897110 (2005-05-01), He et al.
patent: 2002/0142526 (2002-10-01), Khare et al.
patent: 2003/0006412 (2003-01-01), Martin et al.
patent: 2003/0122190 (2003-07-01), Gallia et al.
patent: 2004/0088658 (2004-05-01), Minda
patent: 2005/0098799 (2005-05-01), Bonges, III et al.
patent: 2006/0022274 (2006-02-01), Hasegawa et al.

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