Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2008-04-22
2008-04-22
Kik, Phallaka (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
10711959
ABSTRACT:
Methods, systems and program products are disclosed for selectively scaling an integrated circuit (IC) design: by layer, by unit, or by ground rule, or a combination of these. The selective scaling technique can be applied in a feedback loop with the manufacturing system with process and yield feedback, during the life of a design, to increase yield in early processes in such a way that hierarchy is preserved. The invention removes the need to involve designers in improving yield where new technologies such as maskless fabrication are implemented.
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Heng Fook-Luen
Hibbeler Jason D.
McCullen Kevin W.
Narayan Rani R.
Runyon Stephen L.
Hoffman Warnick & D'Alessandro LLC
International Business Machines - Corporation
Kik Phallaka
Kotulak Richard M.
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