Semiconductor device manufacturing: process – With measuring or testing – Packaging or treatment of packaged semiconductor
Reexamination Certificate
2011-08-09
2011-08-09
Loke, Steven (Department: 2829)
Semiconductor device manufacturing: process
With measuring or testing
Packaging or treatment of packaged semiconductor
C438S014000, C438S107000, C438S109000, C257S686000, C257S777000, C257SE25013
Reexamination Certificate
active
07993939
ABSTRACT:
An integrated circuit package system with laminate base is provided including forming a base package including, forming a laminate substrate strip, mounting an integrated circuit on the laminate substrate strip, forming a molded cover over the integrated circuit and the laminate substrate strip, and performing a strip test of the base package; attaching a bare die to the base package; connecting electrically the bare die to the laminate substrate strip; and encapsulating the bare die and the base package.
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Bathan Henry D.
Camacho Zigmund Ramirez
Punzalan Jeffrey D.
Trasporto Arnel
Ishimaru Mikio
Loke Steven
Stats Chippac Ltd.
Whalen Daniel
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