Semiconductor device manufacturing: process – With measuring or testing – Packaging or treatment of packaged semiconductor
Patent
1997-09-15
2000-04-11
Niebling, John F.
Semiconductor device manufacturing: process
With measuring or testing
Packaging or treatment of packaged semiconductor
438112, 438127, G01R 3126, H01L 2166, H01L 2144, H01L 2148, H01L 2150
Patent
active
060487445
ABSTRACT:
An integrated circuit is provided having an alignment feature integral with the lead frame. The integrated circuit includes a lead frame coupled with a semiconductor die, and is partially encapsulated in insulating material. The lead frame has the alignment feature therein. The alignment feature includes a cut out on the lead frame taking the form of a semi-circle, protuberance, apertures, or slots. Alternatively, the alignment feature includes a removably coupled tab. After testing of the integrated circuit has been completed, the alignment tab is removed from the integrated circuit. The alignment feature can also be provided on a heat spreader which is attached to a side of or within the lead frame package.
REFERENCES:
patent: 3678385 (1972-07-01), Bruner
patent: 5766978 (1998-06-01), Johnson
Corisis David J.
Cram Daniel
King Jerrold L.
Nevill Leland R.
Reynolds Tracy
Jones Josetta
Micro)n Technology, Inc.
Niebling John F.
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