Integrated circuit memory having a fuse detect circuit and metho

Details Integrated circuit memory having a fuse detect circuit and metho Integrated circuit memory having a fuse detect circuit and metho

1999-03-02

2000-12-05

Nelms, David

Static information storage and retrieval

Read/write circuit

Bad bit

3652257, G11C 700

Patent

active

061575836

ABSTRACT:
Fuses and detect circuits (124) in an integrated circuit memory (100) include a copper fuse (208) and a fuse state detect stage (202) for detecting the open circuit state or the closed circuit state of the fuse (208). The fuse detect circuit (124) provides an output signal corresponding to the state of the fuse and during detecting, limits a voltage drop across the fuse to an absolute value independent of a power supply voltage applied to the integrated circuit memory. The fuse detect circuit (124) operates at power up of the integrated circuit memory (100) and is disabled after the state of the fuse is detected and latched, and the power supply is sufficient for reliable operation of the integrated circuit memory (100). By limiting the voltage drop across a blown copper fuse (208), a potential electro-migration problem is reduced.

REFERENCES:
patent: 4446534 (1984-05-01), Smith
patent: 5345100 (1994-09-01), Renfro
patent: 5723999 (1998-03-01), Merritt
patent: 5859801 (1999-01-01), Poechmueller

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