Integrated circuit I/O buffer having pull-up to voltages greater

Details Integrated circuit I/O buffer having pull-up to voltages greater Integrated circuit I/O buffer having pull-up to voltages greater

1997-08-05

2000-02-22

Tokar, Michael

Electronic digital logic circuitry

Interface

Supply voltage level shifting

326 81, 326 87, 326 58, H03K 190175, H03K 1900

Patent

active

060284498

ABSTRACT:
An integrated circuit having a DC current test function operates at a core supply voltage and interfaces at an input-output (I/O) supply voltage. The I/O supply voltage is greater than the core supply voltage. The integrated circuit includes a buffer, a voltage level shifting circuit and a pull-up circuit. The buffer is coupled between a core terminal and a pad terminal. The pad terminal has a voltage swing which is substantially equal to the I/O supply voltage. The voltage level shifting circuit has a test signal input with a voltage swing substantially equal to the core supply voltage and a test signal output with a voltage swing from the I/O supply voltage to a selected bias voltage. The pull-up circuit is coupled to the pad terminal and has a control terminal coupled to the test signal output. The pull-up circuit pulls the pad terminal toward the I/O supply voltage during normal operation and selectively isolates the pad terminal from the I/O supply voltage as a function of the test signal during a DC current test.

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