Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate
2006-08-01
2006-08-01
Hoang, Huan (Department: 2827)
Static information storage and retrieval
Read/write circuit
Bad bit
C365S185080, C365S185090, C365S225700
Reexamination Certificate
active
07085179
ABSTRACT:
A semiconductor integrated circuit device has a fuse device that can be electrically disconnected without a breakage caused by using a laser beam or current. The semiconductor integrated circuit device employs, as the fuse device for storing status information, a MOSFET of a single polysilicon EEPROM-type cell manufactured through a process of fabricating a volatile semiconductor memory cell array.
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Lee Sang-Jae
Park Jong-Wook
Won Myung-Gyoo
Hoang Huan
Volentine Francos & Whitt
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