Integrated circuit fuse-link tester and test method

Details Integrated circuit fuse-link tester and test method Integrated circuit fuse-link tester and test method

1990-08-30

1992-08-18

Popek, Joseph A.

Static information storage and retrieval

Read/write circuit

Testing

3652257, G11C 2900

Patent

active

051405547

ABSTRACT:
A test circuit for determining whether or not fuse-links of an integrated circuit have been opened or closed properly by, for example, a laser device. The test circuit of this invention, in one embodiment, includes a variable impedance, such as a P-channel transistor, connected between a voltage source and an output terminal, the impedance having one value with a first input applied to the variable impedance control terminal and having a second, larger value in response to a second input applied to the variable impedance control terminal. At least one programmable fuse-link and a gate are connected in series between the output terminal and a source of reference potential. A means for providing control inputs to the variable impedance is connected between a test mode input signal and the control terminal of the variable impedance. The means for providing control inputs to the P-channel transistor may include a second, current-mirror-connected P-channel transistor.

REFERENCES:
patent: 4730273 (1988-03-01), Sluss

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