Integrated circuit devices having reducing variable...

Static information storage and retrieval – Read/write circuit – Differential sensing

Reexamination Certificate

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C365S149000

Reexamination Certificate

active

07120073

ABSTRACT:
The illustrated embodiments relate to a process for improving retention time of a set of integrated circuit devices. The process comprises placing the set of integrated circuit devices in a reverse bias condition, and elevating the surrounding temperature of the set of integrated circuit devices for a predetermined period of time.

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