Static information storage and retrieval – Read/write circuit – Differential sensing
Reexamination Certificate
2006-10-10
2006-10-10
Nguyen, Tan T. (Department: 2827)
Static information storage and retrieval
Read/write circuit
Differential sensing
C365S149000
Reexamination Certificate
active
07120073
ABSTRACT:
The illustrated embodiments relate to a process for improving retention time of a set of integrated circuit devices. The process comprises placing the set of integrated circuit devices in a reverse bias condition, and elevating the surrounding temperature of the set of integrated circuit devices for a predetermined period of time.
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Beffa Ray
Meyer Russell L.
Fletcher Yoder P.C.
Micro)n Technology, Inc.
Nguyen Tan T.
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