Integrated circuit device with on-chip setup/hold measuring...

Details Integrated circuit device with on-chip setup/hold measuring... Integrated circuit device with on-chip setup/hold measuring...

2008-03-25

2008-03-25

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07348789

ABSTRACT:
An integrated circuit device disclosed herein includes a test device and a setup and hold measuring circuit. The setup and hold measuring circuit generates a reference signal and a data signal in response to an external clock signal in a test mode of operation. The test device receives the data signal in response to a reference signal, and outputs the inputted data signal as a setup and hold determining circuit. One of the reference signal and the data signal is a multiphase signal synchronized with the external clock signal. The setup and hold measuring circuit detects whether the output of the test device indicates a valid value of the data signal, and generates the detected result to the external as a setup/hold timing margin through at least one pad.

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patent: 2001-0091110 (2001-10-01), None
English language abstract of Korean Application No. 2001-0091110.

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