Integrated circuit device and test method therefor

Details Integrated circuit device and test method therefor Integrated circuit device and test method therefor

1995-08-24

1997-04-08

Nguyen, Viet Q.

Static information storage and retrieval

Read/write circuit

Testing

36518902, 365236, 365233, 324763, 324765, 324 731, G01R 3128, G01R 1512

Patent

active

056194633

ABSTRACT:
An integrated circuit device includes an oscillator; a counter; a switch for selectively connecting the oscillator to the counter in a test mode; and an output circuit for providing the output count generated by the counter for determining the frequency of the oscillator. Thus, use is made of the normal on-chip counter in an integrated circuit to provide a reliable way of measuring the frequency of the on-chip oscillator.

REFERENCES:
patent: 5099196 (1992-03-01), Lingwell
patent: 5218707 (1993-06-01), Little et al.
patent: 5450364 (1995-09-01), Stephens, Jr. et al.
patent: 5457400 (1995-10-01), Ahmad et al.
Standard Search Report dated Nov. 21, 1994.

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