Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-06-26
2007-06-26
Dinh, Paul (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
10819354
ABSTRACT:
A method of testing an integrated circuit design to determine whether or not the design satisfies an electrostatic discharge protection specification, said circuit design incorporating electrostatic discharge protection routes between top-level nodes of the design. The method comprises defining an electrostatic discharge protection score for each of said electrostatic discharge protection routes, for each top-level node pair, calculating an electrostatic discharge score for every route through the active circuit between the top-level nodes, and identifying active circuit routes between top-level node pairs for which the electrostatic discharge score is less than the electrostatic discharge protection score for the corresponding electrostatic discharge protection route, or lies within a predefined amount of that score.
REFERENCES:
patent: 5796638 (1998-08-01), Kang et al.
patent: 6265885 (2001-07-01), Luo et al.
patent: 6292343 (2001-09-01), Pequignot et al.
patent: 6502229 (2002-12-01), Lee et al.
patent: 6725439 (2004-04-01), Homsinger et al.
patent: 2002/0144213 (2002-10-01), Ramaswamy et al.
patent: 2002/0152447 (2002-10-01), Venugopal et al.
Chadfield Stephen R.
O'Connell John B.
Strickland Keith R.
Blakely , Sokoloff, Taylor & Zafman LLP
Dinh Paul
Memula Suresh
LandOfFree
Integrated circuit design and testing does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Integrated circuit design and testing, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Integrated circuit design and testing will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3859015