Integrated circuit design and testing

Details Integrated circuit design and testing Integrated circuit design and testing

2007-06-26

2007-06-26

Dinh, Paul (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000

Reexamination Certificate

active

10819354

ABSTRACT:
A method of testing an integrated circuit design to determine whether or not the design satisfies an electrostatic discharge protection specification, said circuit design incorporating electrostatic discharge protection routes between top-level nodes of the design. The method comprises defining an electrostatic discharge protection score for each of said electrostatic discharge protection routes, for each top-level node pair, calculating an electrostatic discharge score for every route through the active circuit between the top-level nodes, and identifying active circuit routes between top-level node pairs for which the electrostatic discharge score is less than the electrostatic discharge protection score for the corresponding electrostatic discharge protection route, or lies within a predefined amount of that score.

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