Integrated circuit design and testing

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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C716S030000

Reexamination Certificate

active

10819354

ABSTRACT:
A method of testing an integrated circuit design to determine whether or not the design satisfies an electrostatic discharge protection specification, said circuit design incorporating electrostatic discharge protection routes between top-level nodes of the design. The method comprises defining an electrostatic discharge protection score for each of said electrostatic discharge protection routes, for each top-level node pair, calculating an electrostatic discharge score for every route through the active circuit between the top-level nodes, and identifying active circuit routes between top-level node pairs for which the electrostatic discharge score is less than the electrostatic discharge protection score for the corresponding electrostatic discharge protection route, or lies within a predefined amount of that score.

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patent: 6502229 (2002-12-01), Lee et al.
patent: 6725439 (2004-04-01), Homsinger et al.
patent: 2002/0144213 (2002-10-01), Ramaswamy et al.
patent: 2002/0152447 (2002-10-01), Venugopal et al.

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