Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate
2007-10-30
2007-10-30
Vu, Hung (Department: 2811)
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
C257S211000, C438S017000, C438S018000
Reexamination Certificate
active
10444552
ABSTRACT:
During the creation of wiring plans for logic modules, the regions which are left free of interconnects by synthesis methods in upper metal planes are filled to a maximum degree with further interconnects. These interconnects serve to protect the integrated circuit. These further interconnects, depending on the availability of components for driving or evaluation, are embodied as sensor interconnects or else as connectionless interconnects only to confuse potential hackers.
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Greenberg Laurence A.
Infineon Technologies A.G.
Locher Ralph E.
Stemer Werner H.
Vu Hung
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