Integrated circuit chips with removable drivers and/or buffers

Details Integrated circuit chips with removable drivers and/or buffers Integrated circuit chips with removable drivers and/or buffers

1982-05-24

1984-12-11

Fears, Terrell W.

Static information storage and retrieval

Read/write circuit

Testing

371 21, 371 15, G11C 1300

Patent

active

044882670

ABSTRACT:
The organization of a frame portion of an integrated circuit chip to include buffers and drivers as well as a power supply for testing functional elements arranged in a "framed" portion of the chip permits smaller drivers and buffers and a lower power supply to be used during later normal operation. The frame portion may be separated completely after testing.

REFERENCES:
IBM, Tech. Dis. Bul., vol. 15, No. 9, Feb. 1973, pp. 2935-2936, "Shift Register Tester on a Chip", by Barnard et al.
IBM Tech. Dis. Bul., vol. 21, No. 1, Jun. 1978, pp. 5-6, "On-Chip Testing of a Single-Chip Micro Processor", by Leininger.
IBM Tech. Dis. Bul., vol. 19, No. 2, Jul. 1976, "Read-Only Store Checking for Reliability", by Nicoletti.
IBM Tech. Dis. Bul., vol. 17, No. 7, Dec. 1974, "Trouble Shooting LSI Circuit Units", by Howe et al., pp. 1941-1944.

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