Integrated circuit capable of locating failure process layers

Details Integrated circuit capable of locating failure process layers Integrated circuit capable of locating failure process layers

2006-01-30

2008-12-09

Do, Thuan (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000, C716S030000

Reexamination Certificate

active

07464357

ABSTRACT:
An integrated circuit for locating failure process layers. The circuit has a substrate with a scan chain disposed therein, having scan cells connected to form a series chain. Each connection is formed according to a layout constraint of a minimum dimension provided by design rules for an assigned routing layer. Since the connection in the assigned routing layer is constrained to a minimum, the scan chain is vulnerable to variations in processes relevant to the assigned routing layer. The scan chain makes it easier to locate processes causing low yield rate of the scan chain.

REFERENCES:
patent: 5696771 (1997-12-01), Beausang et al.
patent: 6233184 (2001-05-01), Barth et al.
patent: 6618830 (2003-09-01), Balachandran et al.

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