Integrated circuit and method of manufacturing an integrated...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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C438S598000, C438S614000

Reexamination Certificate

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07001834

ABSTRACT:
A packaged IC includes an IC die with signal and signal complement traces positioned relative to each other to maximize broadside coupling for a matching impedance. The signal and signal complement traces are electrically connected to transmission or receive channels of the IC die. Use of a broadside coupled trace configuration alleviates routing congestion in an IC package and permits an IC to accommodate a greater number of channels within a given surface area than is possible under the prior art.

REFERENCES:
patent: 6078100 (2000-06-01), Duesman et al.
patent: 6271478 (2001-08-01), Horiuchi et al.
patent: 6555920 (2003-04-01), Chung et al.

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