Integrated circuit analysis method and program product

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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C716S030000, C716S030000, C716S030000, C716S030000

Reexamination Certificate

active

11261951

ABSTRACT:
A method for analyzing integrated circuits (IC's) has steps of dividing the circuit into a plurality of individual blocks that are linked together. Each block is comprised of a plurality of latches and paths connecting the latches. The blocks are compressed by removing all detail not required for performing global transparency timing modeling.

REFERENCES:
patent: 5452239 (1995-09-01), Dai et al.
patent: 5740347 (1998-04-01), Avidan
patent: 5790830 (1998-08-01), Segal
patent: 6158022 (2000-12-01), Avidan
patent: 6378113 (2002-04-01), Levitsky et al.
patent: 6581197 (2003-06-01), Foutz et al.

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