Integrated circuit analysis method and program product

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C716S030000

Reexamination Certificate

active

06996792

ABSTRACT:
A method for analyzing integrated circuits (IC's) has steps of dividing the circuit into a plurality of individual blocks that are linked together. Each block is comprised of a plurality of latches and paths connecting the latches. The blocks are compressed by removing all detail not required for performing global transparency timing modeling.

REFERENCES:
patent: 5452239 (1995-09-01), Dai et al.
patent: 5740347 (1998-04-01), Avidan
patent: 5790830 (1998-08-01), Segal
patent: 6158022 (2000-12-01), Avidan
patent: 6378113 (2002-04-01), Levitsky et al.
patent: 6581197 (2003-06-01), Foutz et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Integrated circuit analysis method and program product does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Integrated circuit analysis method and program product, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Integrated circuit analysis method and program product will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3662025

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.