Active solid-state devices (e.g. – transistors – solid-state diode – With means to control surface effects – Insulating coating
Reexamination Certificate
2005-10-25
2005-10-25
Lee, Hsien-Ming (Department: 2823)
Active solid-state devices (e.g., transistors, solid-state diode
With means to control surface effects
Insulating coating
C257S637000, C257S642000, C257S702000, C438S622000, C438S623000, C438S624000, C438S781000
Reexamination Certificate
active
06958524
ABSTRACT:
A method of manufacturing an insulating layer, including forming a first dielectric layer having a first pore size over a substrate, shrinking the first pore size to a second pore size by a first densification process, forming a second dielectric layer over the first dielectric layer, and increasing an aggregate dielectric constant of the first and second dielectric layers by a second densification process.
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Li Lih-Ping
Lu Yung-Cheng
Haynes and Boone LLP
Lee Hsien-Ming
Taiwan Semiconductor Manufacturing Company , Ltd.
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