Insulating barrier, NVM bandgap design

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257S324000, C257S325000

Reexamination Certificate

active

07026686

ABSTRACT:
An insulating barrier extending between a first conductive region and a second conductive region is disclosed. The insulating barrier is provided for tunnelling charge carriers from the first to the second region, the insulating barrier comprising a first portion contacting the first region and a second portion contacting the first portion and extending towards the second region, the first portion being substantially thinner than the second portion, the first portion being constructed in a first dielectric and the second portion being constructed in a second dielectric different from the first dielectric, the first dielectric having a lower dielectric constant than the second dielectric.

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patent: 6121654 (2000-09-01), Likharev
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Irrera, Fernanda and Russo, Felice.“Enhanced Injection in n++-poly/SiOx/SiO2/p-Sub MOS Capacitors for Low-Voltage Nonvolatile Memory Applications: Experiment”, IEEE Transactions on Electron Devices, vol. 46. No. 12 (Dec. 1999).
Houssa et al.,“Trap-assisted tunneling in high permittivity gate dielectric stacks”, Journal of Applied Physics, 87(12), pp. 8615-8620 (2000).
Irrera, Fernanda and Marangelo, Luca,“Transport Model in n++-poly/SiOx/SiO2/p-sub MOS Capacitors for Low-Voltage Nonvolatile Memory Applications”, IEEE Transactions on Electron Devices, vol. 47. No. 2, (Feb. 2000).
Copy of European Search Report EP 01 20 4106.

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