Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2004-12-29
2009-12-08
Vu, David (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C438S270000, C257SE29260
Reexamination Certificate
active
07629644
ABSTRACT:
An interlayer dielectric film is completely buried in a trench, and failures caused by step coverage is prevented because a source electrode can be formed substantially uniformly on an upper portion of a gate electrode. Also, in the processes of forming a source region, a body region and an interlayer dielectric film, only one mask is necessary so that the device size is reduced to account for placement error of only one mask alignment.
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Chinese Office Action dated Jun. 22, 2007, directed to counterpart CN application No. 2004101037160 (2 pages).
Ishida Hiroyasu
Kubo Hirotoshi
Miyahara Shouji
Onda Masahito
Saito Hiroaki
Morrison & Foerster / LLP
Sanyo Electric Co,. Ltd.
Vu David
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