Insulated-gate field-effect thin film transistors

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S197000, C438S275000

Reexamination Certificate

active

07018875

ABSTRACT:
A new Insulated-Gate Field-Effect Thin Film Transistor (Gated-FET) is disclosed. A semiconductor Gated-FET device comprises a lightly doped resistive channel region formed on a first semiconductor thin film layer; and an insulator layer deposited on said channel surface with a gate region formed on a gate material deposited on said insulator layer; said gate region receiving a gate voltage having a first level modulating said channel resistance to a substantially non-conductive state and a second level modulating said channel resistance to a substantially conductive state.

REFERENCES:
patent: 4065781 (1977-12-01), Gutknecht
patent: 4502204 (1985-03-01), Togashi et al.
patent: 4672645 (1987-06-01), Bluzer et al.
patent: 5151759 (1992-09-01), Vinal
patent: 5266515 (1993-11-01), Robb et al.
patent: 5340999 (1994-08-01), Takeda et al.
patent: 5537078 (1996-07-01), Strong
patent: 5656844 (1997-08-01), Klein et al.
patent: 5981317 (1999-11-01), French et al.
patent: 6107642 (2000-08-01), Sundaresan
patent: 6222234 (2001-04-01), Imai
patent: 6271063 (2001-08-01), Chan et al.
patent: 6339244 (2002-01-01), Krivokapic
patent: 6380009 (2002-04-01), Battersby
patent: 6406951 (2002-06-01), Yu
patent: 6545319 (2003-04-01), Deane et al.
patent: 6579750 (2003-06-01), Krivokapic
patent: 2001/0028059 (2001-10-01), Emma et al.
patent: 2001/0041399 (2001-11-01), Bonart
patent: 2002/0036320 (2002-03-01), Ichimori et al.
patent: 2002/0079496 (2002-06-01), Deane et al.
patent: 2002/0168804 (2002-11-01), Van der Zaag et al.
patent: 2002/0180069 (2002-12-01), Houston

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Insulated-gate field-effect thin film transistors does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Insulated-gate field-effect thin film transistors, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Insulated-gate field-effect thin film transistors will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3585956

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.