Instrument for analyzing specimen

Details Instrument for analyzing specimen Instrument for analyzing specimen

1988-04-13

1989-08-15

Howell, Janice A.

Radiant energy

Inspection of solids or liquids by charged particles

Electron probe type

250305, H01J 3700

Patent

active

048577316

ABSTRACT:
An x-ray microanalyzer is a useful instrument which obtains an image representing the distribution of the constituent elements of a specimen, by detecting characteristic x-rays produced from a microscopic region on the specimen. The present invention is intended to enhance the efficiency of such an analysis of a specimen using an x-ray microanalyzer. A region of interest is designated upon the aforementioned image. The average weight concentration of the constituent elements in this region or information about the distribution of signal intensities is quickly obtained.

REFERENCES:
patent: 4253154 (1981-02-01), Russ et al.
patent: 4439680 (1984-03-01), Broadhurst
patent: 4553030 (1985-11-01), Tokiwai et al.
"Microbeam Analysis 1985", John T. Armstrong, Ed., Proceedings of the 20th Annual Conference of the Microbeam Analysis Society, Louisville, Ky., 5-9 Aug. 1985, pp. 82-84, 145-147.
"Microbeam Analysis 1986", A. D. Romig, Jr. and W. F. Chambers, Eds., Proceedings of the 21st Annual Conference of the Microbeam Analysis Society, Albuquerque, New Mexico, 11-15 Aug. 1986, pp. 271-278.

Affiliated with

Also associated with

Rating

Instrument for analyzing specimen does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Instrument for analyzing specimen, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Instrument for analyzing specimen will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-123310