Inspection system and process

Details Inspection system and process Inspection system and process

1995-09-15

1998-03-31

Mancuso, Joseph

Image analysis

Applications

Manufacturing or product inspection

382107, G06K 900

Patent

active

057347425

ABSTRACT:
In order to reliably detect a defect on an inspected surface, electronic pictures of the inspected surface are formed at different positions by moving an imaging area relative to the inspected surface. Defect candidate regions are extracted from a series of the pictures. The system examines whether a movement from one candidate region to another candidate region is proportional to the movement of the imaging area. If the movement between the candidate regions is in proportion to the movement of the imaging area, the system judges that the candidate regions are imagery of a defect on the inspected surface.

REFERENCES:
patent: 4396903 (1983-08-01), Habicht et al.
patent: 5027413 (1991-06-01), Barwood
patent: 5243418 (1993-09-01), Kuno et al.
patent: 5247584 (1993-09-01), Krogmann
patent: 5249238 (1993-09-01), Komerath et al.
patent: 5260557 (1993-11-01), Kissh et al.
patent: 5600731 (1997-02-01), Sezan et al.

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