4. Image analysis
  5. Applications
  6. Manufacturing or product inspection

Kazunori Nousou

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Inspection system and process

Image analysis – Applications – Manufacturing or product inspection
Patent

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Method of inspecting a wrap-fitted state of a cap...

Optics: measuring and testing – Inspection of flaws or impurities – Containers or enclosures
Reexamination Certificate

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Photo detecting apparatus for detecting reflected light from an

Radiant energy – Photocells; circuits and apparatus – Photocell controlled circuit
Patent

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Profile ID: LFUS-PAI-P-134376

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