Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-03-17
2008-11-04
Do, Thuan (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
07448002
ABSTRACT:
An inspection system applicable to a data processing device installed with a PCB (printed circuit board) design software and a display unit is proposed, wherein the PCB design software is used for creating PCB totems for a multi-layer PCB, the display unit is used to display an user interface provided by the PCB design software in top view projection, the user interface comprising a plurality of wires and a plurality of planes for specific uses. The inspection system of the present invention first stores information of planar coordinate ranges of the planes respectively corresponding to the wires allowed to be routed thereon in a database. Then, through a coordinate range acquiring module, wire coordinate ranges and planar coordinate ranges corresponding to the plurality of wires on the user interface are acquired each time when a user operates the user interface. Subsequently, a comparing module determines whether each of the wire coordinate ranges only corresponds to one of the planar coordinate ranges, if no, an alerting signal is outputted, otherwise, if each of the wire coordinate ranges corresponds to only one of the planar coordinate ranges, the comparing module further determines whether each of the planar coordinate ranges corresponding to a wire coordinate range is located inside a corresponding planar coordinate range stored in the database, if no, an alerting signal is outputted. Finally, through a display control module, the wires corresponding to the wire coordinate ranges that do not meet the above mentioned conditions are displayed on the display unit of the data processing device according to the alert signal in a predefined way for purpose of inspection.
REFERENCES:
patent: 5883437 (1999-03-01), Maruyama et al.
Fan Bg
Zang Linkke
Corless Peter F.
Do Thuan
Edwards Angell Palmer & & Dodge LLP
Inventec C'orporation
Jensen Steven M.
LandOfFree
Inspection system does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Inspection system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Inspection system will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4021744