Inspection equipment for fine pattern and morphology using...

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C250S492100, C250S492200

Reexamination Certificate

active

07935926

ABSTRACT:
Inspection equipment using a microcolumn is disclosed. The inspection equipment of the present invention can conduct inspection of a fine circuit, which could not be conducted using conventional optical inspection equipment. Furthermore, the present invention can rapidly inspect a display, having a relatively large area, and can have a precise inspection function and a repair function. The inspection equipment of the present invention includes a plurality of microcolumns, a shaft, to which the microcolumns are coupled, and which is disposed in a direction perpendicular to a direction in which an object is moved, and a detector for detecting electron beams radiated from the microcolumns onto the object to determine whether errors exist in a circuit of the object.

REFERENCES:
patent: 3392262 (1968-07-01), Hansen et al.
patent: 4390789 (1983-06-01), Smith et al.
patent: 4764818 (1988-08-01), Crew
patent: 5384463 (1995-01-01), Honjo et al.
patent: 5399860 (1995-03-01), Miyoshi et al.
patent: 5430292 (1995-07-01), Honjo et al.
patent: 6740889 (2004-05-01), Winkler et al.
patent: 6809534 (2004-10-01), Yamada

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Inspection equipment for fine pattern and morphology using... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Inspection equipment for fine pattern and morphology using..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Inspection equipment for fine pattern and morphology using... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2675530

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.