Inspection apparatus, an apparatus for projecting an image...

Optics: measuring and testing – Of light reflection

Reexamination Certificate

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Reexamination Certificate

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07969577

ABSTRACT:
When using a scatterometer different portions of a target area may be at different focal depths. When the whole area is measured this results in part of it being out of focus. To compensate for this an array of lenses is placed in the back focal plane of the high numerical aperture lens.

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Notice of Reasons for Rejection mailed Aug. 13, 2010 for Japanese Patent Application No. 2007-232149, 3 pgs.
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