Inspection apparatus

Details Inspection apparatus Inspection apparatus

2007-07-10

2007-07-10

Tsai, Carol S. W. (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S067000, C455S522000

Reexamination Certificate

active

11180905

ABSTRACT:
An inspection apparatus inspects an inspected object based on a waveform quality of a signal that the inspected object outputs. The inspection apparatus has a power supply section which outputs a control signal that controls an output of the inspected object, a waveform measuring section which measures the signal that the inspected object outputs to generate a waveform image, an analyzing section which derives a value indicating a waveform quality from the waveform image that the waveform measuring section measures, a deciding section which decides whether or not the value derived by the analyzing section satisfies a target value, and an optimizing section which changes a set value of the control signal that the power supply section outputs, based on a decision result of the deciding section.

REFERENCES:
patent: 5613015 (1997-03-01), Suzuki et al.
patent: 5864798 (1999-01-01), Miseki et al.
patent: 6347231 (2002-02-01), Miya
patent: 6801647 (2004-10-01), Arakawa
patent: 6864745 (2005-03-01), Ode et al.
patent: 2001/0014922 (2001-08-01), Kuge
patent: 2002/0089996 (2002-07-01), Komatsu et al.
patent: 2003/0007222 (2003-01-01), Kwasaki et al.
patent: 2004/0049104 (2004-03-01), Kishi
patent: 2004/0090617 (2004-05-01), Geh et al.
patent: 2004/0171352 (2004-09-01), Maeda et al.
patent: 2004/0208260 (2004-10-01), Chan et al.
patent: 2004/0227580 (2004-11-01), Otsuka et al.
patent: 2004/0240569 (2004-12-01), Rudowicz et al.
patent: 2005/0013450 (2005-01-01), Kumazawa
patent: 2006/0025708 (2006-02-01), Sato et al.
patent: 2006/0030272 (2006-02-01), Nakamizo et al.
patent: 2000-295298 (2000-10-01), None
Ikuro Aoki, et al., “Development of HBT-IC Module for 50-GBPS Optical Communication Systems”, Yokogawa Technical Report English Edition, 2002, pp. 1-6, No. 34.
Seiichi Tsutsumi, et al., “Development of Ultra-compact 10Gbit/s Bit Error Rate Testers”, Ando Technical Bulletin, Jan. 2004, pp. 18-22.

Affiliated with

Also associated with

Rating

Inspection apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Inspection apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Inspection apparatus will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3770073