Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location
Reexamination Certificate
2011-03-15
2011-03-15
He, Amy (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
For fault location
C324S761010
Reexamination Certificate
active
07906972
ABSTRACT:
A method of inline inspection of photovoltaic material for electrical anomalies. A first electrical connection is formed to a first surface of the photovoltaic material, and a second electrical connection is formed to an opposing second surface of the photovoltaic material. A localized current is induced in the photovoltaic material and properties of the localized current in the photovoltaic material are sensed using the first and second electrical connections. The properties of the sensed localized current are analyzed to detect the electrical anomalies in the photovoltaic material.
REFERENCES:
patent: 4656419 (1987-04-01), Garlick
patent: 6375347 (2002-04-01), Bruce et al.
Bertsche Kirk J.
Brown David L.
Gotkis Yehiel
Rough J. Kirkwood H.
Soltz David A.
He Amy
Kla-Tencor Corporation
Luedeka Neely & Graham P.C.
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