Infrared temperature control of Czochralski crystal growth

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

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23273SP, 156617SP, 356 72, B01J 1718

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active

040584291

ABSTRACT:
A method and apparatus for controlling the diameter of single crystals grown by the Czochralski process in which an infrared sensor determines the temperatures of the melt adjacent to the crystal and a control circuit compares an average of these temperatures to a reference temperature to provide an error signal which controls the inductive heating of the melt.

REFERENCES:
patent: 2979386 (1961-04-01), Shockley et al.
patent: 3284172 (1966-11-01), Binder
patent: 3493770 (1970-02-01), Dessauer et al.
patent: 3621213 (1971-11-01), Jen
Sutcliffe, et al., "Temperature Control System for a Silicon Pulling Furnace," Review of Scientific Instruments, vol. 27, No. 8, p. 656, (1956).

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